论文部分内容阅读
Common wheat is one of the most important crops in China,which is the largest producer in the world.A set of 230 cultivars was used to identify yield-related loci by association mapping.This set was tested for seven yield-related traits,viz.plant height(PH),spike length(SL),spikelet number per spike(SNPS),kernel number per spike(KNPS),thousand-kernel weight(TKW),kernel weight per spike(KWPS),and sterile spikelet number(SSN)per plant in four environments.A total of 106 simple sequence repeat(SSR)markers distributed on all 21 chromosomes were used to screen the set.Twenty one and 19 of them were associated with KNPS and TKW,respectively.Association mapping detected 73 significant associations across 50 SSRs,and the phenotypic variation explained(R2)by the associations ranged from 1.54 to 23.93%.The associated loci were distributed on all chromosomes except 4A,7A and 7D.Significant and potentially new alleles were present on 8 chromosomes,namely 1A,1D,2A,2D,3D,4B,5B and 6B.Further analysis showed that genetic effects of associated loci were greatly influenced by association panels,and the R2 of crucial loci were lower in modem cultivars than in the mini core collection,probably caused by strong selection in wheat breeding.In order to confirm the results of association analysis,yield-related favorable alleles Xgwm132-6B128,Xgwm135-1A138,Xgwm337-1D186 and Xgwm102-2D144 were evaluated in a double haploid(DH)population derived from Hanxuan10 × Lumai14.These favorable alleles that were validated in various populations might be valuable in breeding for high-yield.