【摘 要】
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A triple axis high-resolution X-ray diffraction system was developed at the X-ray diffraction beamline of Shanghai synchrotron radiation facility.The angular resolution was greatly improved by using a
【机 构】
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Shanghai Institute of Applied Physics,Chinese Academy of Sciences,Shanghai 201204,China;Key Laborato
【出 处】
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第十二届全国X射线衍射学术大会暨国际衍射数据中心(ICDD)研讨会
论文部分内容阅读
A triple axis high-resolution X-ray diffraction system was developed at the X-ray diffraction beamline of Shanghai synchrotron radiation facility.The angular resolution was greatly improved by using an analyzer crystal.In-situ cryostat and flight path were also added to the system.This system was also suitable for Huang diffuse X-ray scattering experiments.Point defects in ZnO films were studied by Huang diffuse X-ray scattering.The type,size,concentration,and symmetry of the defects in ZnO films were obtained.
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