以中国空间技术研究院电子元器件可靠性中心1987～1990四个年度数百份失效分析报告为依据,得到卫星用半导体器件解剖前失效模式分布:逻辑失控占36.3%,开路占22.2%等;失效机理分布:铝腐蚀占1 6.3%,使用不当占14.6%等。该项研究以第一手数据首次全面、系统指出卫星用器件失效模式和机理。为卫星可靠性设计、优选器件厂及器件厂采取措施提供重要依据。 Based on hundreds of failure analysis reports of China Center for Electron Device Reliability of China Academy of Space Technology from 1987 to 1990, the failure mode distribution of satellite semiconductor devices was obtained: 36.3% logic out of control and 22.2% open circuit; Failure mechanism distribution: aluminum corrosion accounted for 1 6.3%, improper use of 14.6% and so on. For the first time, the study used first-hand data to point out the failure modes and mechanisms of satellite devices. For the satellite reliability design, the preferred device factory and device factory to take measures to provide an important basis.