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第四届国际二次离子质谱学会议(SIMS-Ⅳ)于1983年11月13日到19日在日本大阪城附近的箕面观光旅馆(Minoo Kanko Hotel,Osaka,Japan)举行。二次离子质谱学是近十多年发展起来的一门新兴学科。当一次离子在高真空或超高真空条件下打到靶面时,就会从中溅射出正、负二次离子,用质谱法分析这些二次离子,就可以得到有关靶面元素、同位素、化合物的组分以及分子结构和一定的晶格结构信息。通过扫
The 4th International Symposium on Secondary Ion Mass Spectrometry (SIMS-IV) was held on November 13-19, 1983 at Minoo Kanko Hotel, Osaka, Japan near Osaka Castle, Japan. Secondary ion mass spectrometry is a new discipline developed in recent ten years. When an ion strikes the target under high or ultra-high vacuum conditions, positive and negative secondary ions will be sputtered from it, and the secondary ions will be analyzed by mass spectrometry to obtain information about the target element, isotope, compound As well as the molecular structure and certain lattice structure information. Through the sweep