应科研工作需要,我们试制了用晶体管做感温元件,一机可带多个探头的直读式数字温度。经初测,在-30—+50℃测温偏差为±0.1℃,仪器分辨率为±0.01℃。 一、晶体管测温原理与整机结构 晶体管问世之初人们就发现其基-射结正向压降V_(b0)随温度以约-2毫伏/℃近似成线性变化。许多人利用这一特性作过测温尝试,但都因晶体管性能不稳而未能实现。 Should be scientific research work needs, we trial-made transistor temperature sensing components, a machine can take multiple probes direct reading digital temperature. After the initial test, the temperature deviation at -30- + 50 ℃ is ± 0.1 ℃, the instrument resolution is ± 0.01 ℃. First, the transistor temperature measurement principle and machine structure At the beginning of the advent of the transistor found that its base - emitter forward voltage drop V_ (b0) with the temperature of about -2 mV / ° approximately linear change. Many people use this feature as a temperature test, but all failed due to the instability of the transistor.