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我们用飞利浦ＰＷ＿（１５３０ＱＳ）型标准ＬｉＦ单晶来检测鉴定刘奉朝所述的用ｘ射线粉末衍射仪测定晶体材料热膨胀的新技术￣［１］，获得ＬｉＦ在不同温区的线性热膨胀系数为（３．２６±０．０２）×１０￣（－５）／℃（１０．４５－１５．８０℃）、（３．３３±０．０１）×１０￣（－５）／℃（１５．７４－２１．４７℃）、（３．４５±０．０１）×１０￣（－５）／℃（２１．４５－２５．２５℃）和（３．３４±０．０２）×１０￣（－５）／℃（１０．４５－２５．２５／℃），这些结果跟有关文献用传统技术所得的结果相符，跟刘奉朝先前的报道一致。这些结果表明新技术比传统技术先进（准确度高且简便易行）。
We use the Philips PW_ (1530QS) standard LiF single crystal to detect and identify Liu Feng Zhao described by X-ray powder diffraction instrument for the determination of the thermal expansion of crystalline materials new technology [1], LiF obtained in different temperature linear thermal expansion coefficient of (3 .26 ± 0.02) × 10 ~ (-5) / ℃ (10.45 ~ 15.80 ℃), (3.33 ± 0.01) × 10 ~ (-5) / ℃ 21.47 ° C), (3.45 ± 0.01) × 10 -5 / ° C (21.45-25.25 ° C), and (3.34 ± 0.02) × 10 -5 ) / ° C (10.45-25.25 / ° C). These results are consistent with the results obtained from the traditional literature in the relevant literature, consistent with previous reports by Liu Fengchao. These results show that new technology is more advanced (more accurate and easier) than traditional techniques.