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能够在一个一般性表面结构中识别所有单个原子(包括缺陷)的成像方法,对于材料分析将是非常有用的工具。Ondrej Krivanek及其同事已开发出这样一种方法。他们在一个为低电压操作进行了优化的经过像差校正的扫描透射电子显微镜中采用了“环形暗场”(ADF)成像。该方法能以原子分辨率成像,还
An imaging method that can identify all single atoms (including defects) in a general surface structure would be a very useful tool for material analysis. Ondrej Krivanek and colleagues have developed such a way. They used “circular dark field” (ADF) imaging in an aberration corrected scanning transmission electron microscope optimized for low voltage operation. The method can image at atomic resolution, also