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本文介绍我们在国产电子探针基础上建立的Hg_(1-x)Cd_xTe晶体组分测定和评价的规范。几年来应用于大量样品的例行测试中,达到了快速准确的要求。实验方法。所用仪器为DX-3A型扫描电镜,附有波长分散型X射线谱仪。电子束加速电压为25kV。X射线取出角为30°。样品吸收电流为50nA。用CdTe作为标准样品。采
This article introduces the specifications for the determination and evaluation of Hg_ (1-x) Cd_xTe crystal components based on domestic electronic probes. In a few years it has been applied to routine testing of a large number of samples to achieve fast and accurate requirements. experimental method. The instrument used was a DX-3A scanning electron microscope with a wavelength dispersion X-ray spectrometer. The electron beam acceleration voltage is 25kV. X-ray extraction angle of 30 °. The sample absorption current is 50 nA. CdTe is used as a standard sample. Mining