根据界面双层电容值可用来判定自组膜的存在 ,也能得到膜的几何厚度 ;但不能说明自组膜的完美程度 .由跨膜电子转移的速度常数 ,可以得到自组膜的电化学表观有效厚度 ,并定量描述非电活性的自组膜 (单分子层膜或双层膜 )中“倒塌”缺陷的程度 .二者数值不同但不矛盾 ,通过计算说明了自组膜中小面积的“倒塌”缺陷决定了跨膜电子转移的速度常数 ,但对自组膜电容的影响不大 . According to the interface double-layer capacitance value can be used to determine the existence of self-assembled film, but also can get the geometrical thickness of the film, but can not explain the perfect degree of self-assembled film by transmembrane electron transfer rate constant, can be self-assembled film electrochemical Apparent effective thickness and quantificationally describe the degree of “collapse” defects in non-electroactive self-assembled films (monolayers or bilayers), which are different but not inconsistent, The “collapse” defect determines the transmembrane electron transfer rate constant, but has little effect on the self-assembled membrane capacitance.