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亚毫米波介质特性的测量对亚毫米波的开发有重要意义,亚毫米波接收及测试系统的各种准光元部件,如窗口材料、介质波导、分束器、双工器、衰减器及透镜等的设计,都要求有这一波段的介质材料的精确数据作为依据;介质常数的测量还有助于了解材料的损耗机理和驰豫现象的研究。在这一波段,物质分子多种吸收机理共存,使介质特性随频率变化很快,有些在微波段是“透明”的物质,到了亚毫米波段就完全不‘透明’了。更重要的是在这个波段里,有关介质特性的研究还很薄弱,材料介电常数的数据非常缺乏。因此,我们在国家自然科学基金资助下,选择典型的亚毫米波频率(890 GHz),初步建立起亚毫米波介质特性测试系统,由石英、TPX、聚四氟乙烯等材料的介质特性进行了测量。
The measurement of submillimeter medium characteristics is of great importance to the development of submillimeter waves. Various sub-millimeter wave receiving and testing system quasi-optical components such as window materials, dielectric waveguides, beam splitters, duplexers, attenuators and The design of the lens and the like requires the accurate data of the dielectric material in this band as a basis. The measurement of the dielectric constant also helps to understand the material loss mechanism and the relaxation phenomenon. In this band, the coexistence of a variety of absorption mechanisms of the material molecules makes the properties of the medium change rapidly with the frequency. Some of them are “transparent” materials in the microwave range, and are completely 'transparent' to the sub-millimeter range. More importantly, in this band, the study of dielectric properties is still very weak, the material dielectric constant data is very scarce. Therefore, under the support of the National Natural Science Foundation of China, we selected a typical sub-millimeter wave frequency (890 GHz) and established a sub-millimeter wave dielectric characteristic test system. The system was measured by the dielectric properties of materials such as quartz, TPX and PTFE .