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本文使用固态检测器－光电二极管阵列（ＰＤＡ）或电荷耦合器件（ＣＣＤ）在ＩＣＰ－ＡＥＳ上实现了无需知道基体浓度情况下对复杂组分中微量元素进行测定的计算机差谱改进法。用Ｃ语言编写了实施差谱技术以及实验室例行分析的软件，探讨了方法的原理，对Ｖ基体中Ａｌ，Ａｌ和Ｍｇ基体中Ｖ的测定结果表明，该差谱技术能准确消除复杂基体产生的光谱干扰。
In this paper, a solid-state detector-photodiode array (CCD) or a charge-coupled device (CCD) is used to realize the ICP-AES method for the determination of trace elements in complex components without knowing the concentration of matrix. The software of differential technique and routine laboratory analysis was written in C language. The principle of the method was discussed. The determination of V in Al, Al and Mg matrix in V matrix showed that the difference spectrum technique can accurately eliminate complex matrix The resulting spectral interference.