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催化剂表面性质研究一种以SiO_2为担体的Cu/SiO_2加氢催化剂,通过对N1s和O1s电子谱的分析,判明催化剂制备过程中存在的铜氨络合物的结构为Cu(NH_3)_4(NO_3)_2,否定Cu(NH_3)_4(OH)_2或Cu(NH_3)_4(NO_3)(OH)结合。又对氢还原后的催化剂的Cu2p_(3/2)电子谱的测定,结合能从936.5eV降到933.6eV,说明铜的价态发生了变化,即铜被还原。从再生前后的催化剂的C1s测定,探明催化剂失活的主要原因是表面积炭。作者还探讨了Ni/SiO_2催化剂。以Al_2O_3为担体的铱催化剂的XPS研究也有报导。
Catalyst Surface Properties A Cu / SiO_2 hydrogenation catalyst supported on SiO_2 was studied. It was found from the electronic spectra of N1s and O1s that the structure of Cu (NH_3) _4 (NO_3 ) _2, negating the binding of Cu (NH_3) _4 (OH) _2 or Cu (NH_3) _4 (NO_3) (OH). In addition, the Cu2p_ (3/2) electron spectrum of the hydrogen-reduced catalyst decreased from 936.5eV to 933.6eV, indicating that the valence state of copper changed, that is, the copper was reduced. From the pre-regeneration catalyst C1s determination, the main reason for the deactivation of the catalyst is the surface carbon deposition. The authors also discussed the Ni / SiO 2 catalyst. XPS studies of iridium catalysts supported on Al 2 O 3 have also been reported.