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:本文用XRD、SEM等分析手段 ,对用Sol -Gel法制备的Gel膜在不同热处理条件下处理后的KTN薄膜进行分析。发现热处理的气氛、升降温速率、烧结温度对薄膜的结构和形貌影响很大 ,并对其的影响进行了分析讨论。在合适的热处理条件下 ,在SrTiO3 ( 1 0 0 ,1 1 1 )衬底上制备出了高取向、晶粒大小均匀、排列紧密、纯钙钛矿结构的KTN薄膜
In this paper, XRD, SEM and other analytical means, the gel films prepared by Sol-Gel method were treated under different heat treatment conditions KTN films were analyzed. It is found that the atmosphere of the heat treatment, the rate of temperature rise and the sintering temperature have a great influence on the structure and morphology of the film, and the influence of the atmosphere on the film is analyzed and discussed. KTN thin film with high orientation, uniform grain size and compact arrangement and pure perovskite structure was prepared on the substrate of SrTiO3 (1001, 1 1 1) under appropriate heat treatment conditions