本文利用“理想繁流放电微观理论”一文所得结果,为电离真空计建立了一个基本理论。 从所得理论结果发现:破坏线性关系的因素,除了已知的电子繁流现象外,尚存在另外一个因素—电离碰撞几率的影响。同时还证明了这两个因素对线性关系破坏的趋向是相同的。 作者尝试应用“碰撞序”及“电子代”概念来对电离真空计的微观过程做较深入的了解。 In this paper, we use the results of “Micro-Theory of Ideal Discharge Discharge” to establish a basic theory for ionization vacuum gauge. From the theoretical results obtained, it is found that the factors that undermine the linear relationship, in addition to the known phenomenon of electron multiplication, there is another factor - the impact of ionization collision probability. It also proves that the tendency of the two factors to destroy the linear relationship is the same. The author attempts to use the concept of “collision order” and “electronic generation” to make a deep understanding of the microscopic process of ionization vacuum gauges.