上海市测试技术研究所研制的三种X射线衍射α—SiO_2标样于84年1月通过鉴定,公开发放。三种标样为: 1.X射线衍射仪校正及鉴别用的α—SiO_2标样。粒度<20μm,纯度>99.99%,点阵常数a_0=4.9132(?)±0.0001(?),C_0=5.4051(?)±0.0001(?)(25℃)。可作为鉴别X射线衍射仪分辨率、仪器角度标定和精确测定未知样品点阵常数的内标(测量误差 Three kinds of X-ray diffraction α-SiO 2 standard samples developed by Shanghai Institute of Test Technology passed the appraisal in January, 84, and were released. Three standard samples are: 1. X-ray diffractometer calibration and identification of α-SiO_2 standard. The particle size is less than 20μm and the purity is more than 99.99%. The lattice constants a_0 = 4.9132? 0.0001 ?, C_0 = 5.4051? 0.0001? Can be used as an internal standard to identify X-ray diffraction resolution, instrument calibration and accurate determination of unknown sample lattice constants (measurement error