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研究了当双极晶体管芯片有源区出现热斑时流经其发射结的电流的趋热行为及其对用ΔＶＢＥ法测量结温的影响，提出了一种快速判定器件有源区温度分布均匀性的办法。
The thermal behavior of the current flowing through the emitter junction of the active region of a bipolar transistor chip and its effect on the junction temperature measured by the ΔVBE method are studied. A method is proposed to quickly determine the temperature distribution in the active region of the device. Sexual approach.