Built-in-test(BIT) is responsible for equipment fault detection, so the test data correctness directly influences diagnosis results. Equipment suffers all kinds of environment stresses, such as temperature, vibration, and electromagnetic stress. As embedded testing facility, BIT also suffers from these stresses and the interferences/faults are caused, so that the test course is influenced,resulting in incredible results. Therefore it is necessary to monitor test data and judge test failures.Stress monitor and BIT self-diagnosis would redound to BIT reliability, but the existing antijamming researches are mainly safeguard design and signal process. This paper focuses on test results monitor and BIT equipment(BITE) failure judge, and a series of improved approaches is proposed. Firstly the stress influences on components are illustrated and the effects on the diagnosis results are summarized. Secondly a composite BIT program is proposed with information integration, and a stress monitor program is given. Thirdly, based on the detailed analysis of system faults and forms of BIT results, the test sequence control method is proposed. It assists BITE failure judge and reduces error probability. Finally the validation cases prove that these approaches enhance credibility. Built-in-test (BIT) is responsible for equipment fault detection, so the test data correctness directly-potential diagnosis results. Equipment suffers all kinds of environment stresses, such as temperature, vibration, and electromagnetic stress. suffers from these stresses and the interferences / faults are caused, so that the test course is influenced, resulting in incredible results. It is necessary to monitor test data and judge test failures. Start monitor and BIT self-diagnosis would redound to BIT reliability : the theatrical anti-jamming components are illustrated and the effects of the series of improved methods; and the existing antijamming researches are mainly safeguard design and signal process. This paper focuses on test results monitor and BIT equipment (BITE) failure judge, and a series of improved approaches is proposed. on the diagnosis results are summarized. Secondary a composite BIT program is proposed with information integration, and a stress monitor Thirdly, based on the detailed analysis of system faults and forms of BIT results, the test sequence control method is proposed. It assists BITE failure judge and reduces error probability.