一、引言高效多层电介质镀膜现被广泛地用于各种领域。为评价它们的机械及化学性能设计了多位种方法。然而实际上光学性能只能根据测量具有代表性的参考样品(位于镀膜室中靠近基本部件处)来确定。通常使用仅能准确测定平面、薄、小型的样品透射比的工业双光束光谱光度计对参证样品进行测量。透镜的测量一般也是将小平面样品与标准金属镀膜比较实现 I. INTRODUCTION Efficient multi-layer dielectric coating is widely used in various fields. A number of methods have been devised to evaluate their mechanical and chemical properties. In practice, however, the optical properties can only be determined by measuring a representative reference sample located in the coating chamber near the basic part. The certified sample is usually measured using an industrial dual-beam spectrophotometer that can only accurately determine the transmittance of flat, thin, and small samples. The measurement of the lens is generally achieved by comparing a facet sample with a standard metal coating