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为定量研究在PHEMT栅电流退化过程中,不同失效机理对应的参数退化时间常数及退化比例,本文基于退化过程中物理化学反应中反应量浓度与反应速率的关系,建立了PHEMT栅电流参数退化模型.利用在线实验的方法获得PHEMT电学参数的退化规律,分析参数随时间的退化规律,得到不同时间段内影响栅电流退化的失效机理,并基于栅电流参数退化模型,得到了不同的失效机理对应的参数退化时间常数及退化比例.
In order to quantitatively study the parameter degradation time constants and degradation ratios of PHEMT gate current degeneration process, this paper established a degradation model of PHEMT gate current parameters based on the relationship between the reaction concentration and the reaction rate in the physicochemical reaction during the degradation process The degradation rules of PHEMT electrical parameters were obtained by online experiments, the degradation rules of parameters with time were analyzed, and the failure mechanisms that affected the degradation of grid current in different time periods were obtained. Based on the degradation model of grid current parameters, different failure mechanisms were obtained The parameter degradation time constant and degradation ratio.