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本文描述隧道谱仪的测量原理,并给出一个隧道谱测量系统的结构。利用该系统测量了硅隧道二极管和分子束外延单晶态CoSi_2/N~+-Si肖特基势垒二极管中的硅声子谱,以及GaAs/Al_xGa_(1-x)As双垒单量子阱中的不同共振隧穿机构。显示了隧道谱仪是研究固体中量子隧穿现象的一种有力工具。
This article describes the measurement principle of the tunnel spectrometer and gives the structure of a tunnel spectrum measurement system. The system is used to measure the silicon phonon spectra of silicon tunnel diode and molecular beam epitaxial single-crystal Schottky barrier CoSi_2 / N ~ + -Si as well as the GaAs / Al_xGa_ (1-x) As single- In the different resonant tunneling mechanism. The tunnel spectrometer is shown to be a powerful tool for studying the phenomena of quantum tunneling in solids.