以DuPont公司的商用TeflonFEPA型薄膜为例 ,通过热脉冲技术、等温表面电位衰减测量和开路热刺激放电电流谱分析等实验结果 ,讨论了经常温和高温电晕充电后样品厚度对薄膜驻极体的沉积电荷密度、薄膜驻极体的内电场、体电导率以及电荷储存稳定性的影响 .通过热脉冲技术组合电导率 温度曲线的测量 ,研究了在不同温度条件下样品厚度对沉积电荷层的平均电荷重心移动的影响 .结果表明 :在充电参数一定的条件下 ,随着膜厚的降低 ,储存电荷密度上升 ,但电荷稳定性有所下降 .因此 ,合理地调控薄膜厚度 ,可以有效地优化驻极体的电荷储存能力及电荷稳定性 Taking DuPont’s commercial TeflonFEPA thin film as an example, the experimental results of thermal pulse technique, isothermal surface potential decay measurement and open-circuit thermal stimulated discharge current spectrum were used to discuss the effect of sample thickness on the electret Deposition charge density, internal electric field, bulk conductivity and charge storage stability of the thin film electret.According to the measurement of the conductivity curve of the combination of the thermal pulse technique, the average thickness of the deposited charge layer under different temperature conditions The results show that under certain charge parameters, the charge density increases with the decrease of the film thickness, but the charge stability decreases. Therefore, the film thickness can be effectively controlled to optimize the charge Polar charge storage capacity and charge stability