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本文提出了一种通过外接电容的耦和电压推算出晶体管特性的矩阵器件测试方法。利用本系统可以对晶体管进行逐个扫描,并推算出缺陷的类型和分布、矩阵板的均匀性及器件特性。同时文中引入了统计分析以确定标准值的范围。
In this paper, a test method of matrix device is proposed to calculate the transistor characteristics by the coupling voltage of external capacitor. The system can be used to scan the transistors one by one, and calculate the type and distribution of defects, the uniformity of the matrix board and device characteristics. At the same time, statistical analysis was introduced to determine the range of standard values.