论文部分内容阅读
During the last decade focused ion beam(FIB)processing has become an essential tool for sub-surface(3D)metrology and the site specific fabrication of ultrathin lamellas suitable for transmission electron microscopy.Beside these inspection and preparation related applications,FIB processing also attracted enormous attention as rapid-prototyping tool with respect surface modification and 3D structuring down to the lower nanometer scale.