本文概述了数字系统的内装自测试(BIST)的原理和实现。在第Ⅰ部分,作者提出了BIST的各种论点以及经济上的优劣,并介绍了有关的分层测试结构。解释了基本BIST的模式产生和响应分析概念。在第Ⅰ部分还补充讨论了LFSR理论,在第Ⅱ部分,将讨论BIST的硬件实现、应用和工具。 This article outlines the principles and implementation of built-in self-testing (BIST) for digital systems. In Section I, the author presents various arguments for the BIST as well as its economic merits, and presents the relevant hierarchical testing structure. Explains the basic BIST pattern generation and response analysis concepts. Part I also complements the discussion of LFSR theory, and in Part II the BIST hardware implementation, applications and tools will be discussed.