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本方法是根据玻璃微电极内阻高、存在尖端电位的特点,用经过改进的数字式万用表串接电位补偿器后直接测定通常的玻璃微电极被测系统两端阻值。一般数字式万用表电阻挡的最高量程为20MΩ,改变该表有关电阻,将该挡量程扩展为100MΩ;补偿器则由电池串接电位器,以产生能抵消电极尖端电位之电位。曾与目前常用的微电极放大器作以下实验对比:一、取已知值的电阻取代被测系统的玻璃微电极作模拟电极测量。二、测量玻璃微电极阻值。结果表明:比目前常用的微电极放大器加示波器以及用电子管复用表等测定方法,本法的可靠性及精确性有所提高,操作简便;且一般实验室毋需另置设备,即可做到。
The method is based on the high resistance of the glass microelectrode, the presence of tip potential characteristics, with improved digital multimeter connected to the potential compensator direct determination of the common glass microelectrode system under test both ends of the resistance. General digital multimeter blocking the maximum range of 20MΩ, change the table on the resistance, the range will be extended to 100MΩ; compensation by the battery in series with the potentiometer to produce a potential to offset the tip of the electrode potential. Have been used with the current microelectrode amplifier for the following experimental comparison: First, take the known value of the resistance instead of the glass system under test for microelectrode electrode measurements. Second, measure the glass microelectrode resistance. The results show that compared with the commonly used micro-electrode amplifier plus oscilloscope and the method of using the tube multiplexing table, the reliability and accuracy of this method have been improved and the operation is simple and convenient. In addition, the general laboratory does not need another device and can do it To