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本文用循环伏安法研究了微盘电极的边缘效应及比电容,提出了滞留效应的概念,用以描述微盘电极(实际)伏安曲线与理想的典型的“S”型稳态伏安曲线的偏离程度.并用它解释了循环伏安曲线出现滞后环(正反扫描的曲线分离)的原因.导出了微盘电极表面反应区内产物与反应物的浓度及滞留比的计算公式.滞留比与V~(1/2)成正比,计算结果满意地解释了实验现象.
In this paper, the edge effect and specific capacitance of micro-disk electrode were studied by cyclic voltammetry. The concept of retention effect was proposed to describe the relationship between (actual) volt-ampere curve of micro disk and ideal typical “S” And explains the reason why the cyclic voltammetry curve has a hysteresis loop (curve separation of positive and negative scanning), and the formula for calculating the concentration and retention ratio of products and reactants on the surface of the microdisk electrode is derived. ~ (1/2) is proportional to the calculated results satisfactorily explain the experimental phenomenon.