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为保证微波集成电路(以下简称MIC)的长期稳定可靠,根据我们的工艺实践和体会,对影响MIC稳定可靠的宏观、微观缺陷及化学污染隐患进行分析并给出消除办法。
In order to ensure the long-term stability of the microwave integrated circuit (hereinafter referred to as MIC), according to our process practice and experience, macroscopic and microscopic defects that affect the stability and reliability of the MIC are analyzed and the elimination measures are given.