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ICP-AES中的发射谱线很多,因此它们相互间的光谱干扰可能成为分析工作者十分恼头的事,特别是当其不得不去分析富铁或稀土材料等样品时,则更是如此。根据波长表确定发射线间的波长差与光谱仪的分辨能力相比已“足够大”从而选定无干扰分析线是一种费时的办法。而且“足够大”的程度也有点不充分,因为如果干扰线的振子强度或干扰元素的浓度要比待测物大得多的话,谱线的侧翼就可能使距干扰线“足够远”的分析线的背景提高。用测量实际光谱的办法可以很容易地验证这一点。但是如果样品量很少,就不可能用它来作此试验。这时进行模拟就有其重要意义。ICP-AES的光谱轮廓可以近似地用高斯轮廓加以表述,因为其宽度主要由多普勒效应确定:式中,λ_0~i和Δλ_(1/2)~i分別为发射谱线i的波长及其半峰高处的宽度。
Since there are many emission lines in ICP-AES, their spectral interference with each other can be extremely troublesome to the analyst, especially when they have to analyze samples such as iron-rich or rare earth materials. Determining the wavelength difference between emission lines based on the wavelength table is “large enough” compared to the resolving power of the spectrometer to select a non-interference analysis line is a time-consuming method. And the “big enough” is a bit inadequate because the side flanks of the line may make the analysis “far enough” away from the glitch line if the glitch strength of the glitch line or the concentration of interfering elements is much greater than the DUT The background of the line is raised. This can be easily verified by measuring the actual spectrum. But if the amount of sample is small, it can not be used for this test. At this time to simulate it has its significance. The spectral profile of ICP-AES can be approximated with a Gaussian profile because its width is mainly determined by the Doppler effect: where λ_0 ~ i and Δλ_ (1/2) ~i are the wavelengths of emission line i and The width of its half-height.