可利用X射线光电子谱对分布在电致发光粉表面上的硫化铜进行细微的分析研究。这种分析法的基本原理是把能量为hv的单色x射线辐射光束打到被研究的材料上。光(量)子激发原子中那些束缚能E_(CB)小于hv能级上的电子,但各能级上电子的激发几率不一样。因此光电子谱中谱线强度就不等。从原子能级激发电子所必须的能量与电子动 X-ray photoelectron spectroscopy can be used to analyze the copper sulfide distributed on the surface of electroluminescent powder. The basic principle of this analysis is to hit the monochromatic x-ray beam of energy hv onto the material under study. The binding energy E_ (CB) in the light (quantum) excited atom is smaller than the electron in the hv level, but the probability of the electron excitation at each energy level is different. Therefore, the spectrum of the photoelectron spectrum intensity is not equal. The energy and electrons necessary to excite electrons from the atomic level