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四氯化硅是光导纤维的原料之一,为了减少光纤中光吸收的分贝数,就需对原料四氯化硅中锰、铁,铬、钒、钛、铜、镍、钴等有害杂质加以检测。我们用感应耦合等离子体(ICP)光源对这些有害元素进行了光谱测定。这种光源具有检出限低,稳定性好,组份影响较小、无电极沾污,并且摄谱前处理简便、使用方便等优点。四氯化硅沸点较低(57.6℃),易挥发。为了防止杂质损失,我们采用在室温或45℃左右,通入低流量氮气驱除基体,残留的杂质进行光谱测定,并进行了回收
Silicon tetrachloride is one of the raw materials of optical fiber. In order to reduce the decibel number of light absorption in the optical fiber, harmful impurities such as manganese, iron, chromium, vanadium, titanium, copper, nickel and cobalt in the raw material silicon tetrachloride are required to be added Detection. We measured these harmful elements using Inductively Coupled Plasma (ICP) light sources. The light source has the advantages of low detection limit, good stability, less impact on the composition, no electrode contamination, simple and convenient handling before the spectrograph. Low boiling point of silicon tetrachloride (57.6 ℃), volatile. In order to prevent the loss of impurities, we use at room temperature or around 45 ℃, pass into the low-flow nitrogen purge the matrix, the residual impurities were measured spectrophotometry, and were recycled