讨论了利用重离子研究宇航半导体器件单粒子效应（ＳＥＥ）时应重视的几个问题，即空间辐射环境中的重离子，粒子辐射对半导体器件的影响和利用重离子束进行ＳＥＥ测试，以及重离子和质子在器件单粒子效应研究中的关系，最后介绍单粒子翻转重离子显微学。 Some problems that should be paid more attention to when using heavy ions to study single event effect (SEE) of aerospace semiconductor devices are the heavy ion in space radiation environment, the influence of particle radiation on semiconductor devices and the SEE test using heavy ion beam, Ion and proton in the device single-particle effect of the relationship between the last single-particle inversion heavy ion microscopy.