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针对航空发动机关键构件高温测试的技术难题,研究了1种用晶体作为传感器的测温技术,阐述了晶体的退火特性和缺陷观察方法,利用X射线衍射(XRD)研究中子辐照SiC晶体的退火特性,发现辐照后晶体的XRD峰的半高宽(Full Width at Half Maximum,FWHM)增大,又随退火温度的升高,在700～1230℃呈线性规律的回复。基于此发展了1种适合测量高温和复杂温度场的技术方法。采用添加K2CO3的KOH为腐蚀剂,对辐照前、后以及辐照后退火的SiC单晶进行位错腐蚀观察,结果表明:经中子辐照的晶体中位错面积比随退火温度的变化趋势与FWHM的变化趋势基本一致,由此认为经中子辐照所产生的位错可能是导致XRD峰的FWHM变化的1个重要因素。
Aiming at the technical problems of high temperature testing of the key components of aeroengine, a temperature measurement technique using crystal as a sensor was studied. The annealing characteristics and defect observation methods of the crystal were described. X - ray diffraction (XRD) The FWHM of the XRD peak of the irradiated crystal was found to increase with the increase of the annealing temperature. The XRD pattern of the irradiated crystal showed a linear response at 700 ~ 1230 ℃. Based on this, a technique suitable for the measurement of high temperature and complex temperature fields has been developed. Dislocation corrosion of SiC single crystals annealed before, after and after irradiation was observed by using KOH with K2CO3 as etchant. The results showed that the dislocation area ratio of the neutron-irradiated crystals changed with the annealing temperature It shows that the dislocations generated by neutron irradiation may be one of the important factors leading to the change of FWHM of XRD peak.