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确切知道X射线管激发的原级能谱分布是X射线荧光分析中的一个重要前提,所用能谱分布函数的准确度大大影响了最终的测量结果。提出利用间接测量法,选用合适的参量模型来描述X射线的原级能谱分布。依靠实验测得的厚靶纯元素样品的荧光强度,利用已知的理论公式,建立非线性方程,优化得到参量模型中的参量值。通过比较实验测得的元素的荧光强度值和利用得到的能谱分布函数计算的理论值,证明此种方法是可行的。
It is well known that the primary energy spectrum of X-ray tube excitation is an important prerequisite in X-ray fluorescence analysis. The accuracy of the energy spectrum distribution function used greatly affects the final measurement results. It is proposed to use the indirect measurement method to select the appropriate parameter model to describe the primary energy spectrum of X-ray. Relying on the fluorescence intensity of the thick target pure element samples measured experimentally, the nonlinear equation was established by using the known theoretical formula, and the parameter values in the parametric model were optimized. It is proved that this method is feasible by comparing the experimentally measured values of the fluorescence intensity of the element and the theoretical value calculated by the obtained spectral distribution function.