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在稀土光谱分析中,目前为了测定高纯稀土氧化物中的微量其他稀土杂质,往往需要借助化学分离和富集。常选用的手段是离子交换法和萃取法,但手续都嫌过烦,耗时太长。所以六十年代以来许多人研究加入适当载体的方法,试图提高直接光谱法的灵敏度和准确性。所用的载体物质主要是CsF、NaCl、CsCl及混合载体LiF—AgCl。但至今在载体的选择上仍有很大的盲目性。71年后,日本学者Y. Osumi在光谱分折Eu_2O_3、Y_2O_3和Nd_2O_3中的稀土杂质时,开始对载体的选择和作用进行探
In the rare earth spectroscopy analysis, at present, in order to measure trace amounts of other rare earth impurities in high purity rare earth oxides, chemical separation and enrichment are often required. Commonly used means of ion exchange and extraction method, but the procedures are too annoying, time-consuming. So many people since the sixties since the method of adding the appropriate carrier, trying to improve the sensitivity and accuracy of direct spectroscopy. The carrier materials used are mainly CsF, NaCl, CsCl and mixed carrier LiF-AgCl. But so far the choice of carrier still has a lot of blindness. After 71 years, Japanese scholar Y. Osumi began to probe the selection and the role of the carrier in the spectral analysis of the rare earth impurities in Eu 2 O 3, Y 2 O 3 and Nd 2 O 3