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本文在简要介绍玻璃钝化封装二极管(以下简称玻封二极管)可靠性指标的基础上,着重论述了决定该器件的电学性能、结构形式、封装材料及钝化技术对其可靠性的影响,最后得出几点结论.
Based on the brief introduction of the reliability index of glass-passivated package diode (hereinafter referred to as glass-sealed diode), this article focuses on the influence of the electrical performance, structure, encapsulation material and passivation technology on the reliability of the device. Finally, Come to a few conclusions.