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为了测出氮化层的真正应力状态,本文提出了选用氮化层中主要氮化物的X-射线衍射峰来测定应力的方法。首先在等强樑夹具上测定氮化层的弹性常数(S_2/2、S_1),然后测出真正氮化层的应力状态。结果表明:表面氮化层应力是内部α-Fe扩散层的应力的3～4倍。由此可见仅采用内层的α-Fe(211)衍射峰来测定表面氮化层应力是不妥当的。
In order to measure the true stress state of the nitride layer, a method of determining the stress by using the X-ray diffraction peak of the main nitride in the nitride layer is proposed. Firstly, the elastic constants (S 2/2, S 1) of the nitrided layer were measured on an isotropic beam fixture, and then the stress state of the real nitrided layer was measured. The results show that the stress of the surface nitride layer is 3 ~ 4 times of the stress of the internal α-Fe diffusion layer. It can be seen that it is not proper to use only the inner α-Fe (211) diffraction peak to determine the surface nitride layer stress.