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根据1/f噪声结构,基于压缩感知(CS)的正交匹配追踪去噪(OMPDN)算法,以小波树结构为分解条件,提取大功率半导体激光器(LDs)中的白噪声及1/f噪声。以小波基作为稀疏基,高斯随机矩阵作为测量矩阵对信号测量并进行CS的重建,滤除白噪声后准确提取1/f噪声信号进行器件参数估计。实验结果表明,本文方法对高斯白噪声混杂的1/f噪声进行估计,比小波变换估计更加逼近真实值。检测估计出的1/f噪声拐点位置及频率指数γ值,为分析LDs可靠性的后续工作奠定了基础。
According to 1 / f noise structure, OMPDN algorithm based on compressive sensing (CS) and white noise and 1 / f noise in high power semiconductor lasers (LDs) are extracted based on wavelet tree structure . Taking wavelet base as sparse basis and Gaussian random matrix as measurement matrix, the signal was measured and CS was reconstructed. The white noise was filtered out and the 1 / f noise signal was accurately extracted to estimate the device parameters. The experimental results show that the proposed method estimates the 1 / f noise mixed with white Gaussian noise, which is closer to the true value than the wavelet transform. Detecting the estimated 1 / f noise inflection point position and frequency index γ value, laid the foundation for the follow-up work to analyze the reliability of LDs.