论文部分内容阅读
偶氮金属镍 (Ni(azo) 2 )是一类具有很大潜力的可录光盘存储介质。为了准确地获取一种偶氮金属镍薄膜的光学常数 ,用旋涂法 (Spin- coating)在单晶硅片上制备了 Ni(azo) 2 薄膜。在波长扫描和入射角可变全自动椭圆偏振光谱仪上研究了 Ni(azo) 2 薄膜的椭偏光谱。采用逼近算法获得了 Ni(azo) 2 薄膜在可见光范围内的复折射率、复介电函数、吸收系数和薄膜厚度。分析了 Ni(azo) 2 薄膜可见吸收光谱的形成机理。结果表明在波长 6 5 0 nm处薄膜的折射率为 2 .19,吸收常数为 0 .0 2 3,具有良好的吸收和反射特性 ,显示出作为高密度数字多用光盘 (DVD- R)记录介质的良好应用前景。
Azo-metal nickel (Ni (azo) 2) is a class of recordable optical storage media with great potential. In order to accurately obtain the optical constants of azo metal nickel films, Ni (azo) 2 thin films were prepared on single crystal silicon wafers by spin-coating. The ellipsometry of Ni (azo) 2 thin films was investigated on a wavelength-changing and angle-of-variation automatic ellipsometer. The complex refractive index, complex dielectric function, absorption coefficient and film thickness of Ni (azo) 2 thin film in the visible range were obtained by using the approximation algorithm. The formation mechanism of visible absorption spectrum of Ni (azo) 2 thin film was analyzed. The results show that the film has a refractive index of 2.19 at a wavelength of 650 nm and an absorption constant of 0.023, which has good absorption and reflection characteristics and shows excellent performance as a high-density digital versatile disk (DVD-R) recording medium Good application prospects.