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分析了基于偏振光分量强度测量来确定波片参数的方法,指出这类方法在任意波片的测量上存在的不确定性。分析表明,波片相位延迟量与光强测量值之间存在多值函数关系,因而无法仅由线偏振分量光强测量值来确定波片相位延迟量的真正值,包括无法得到波片的级次及快轴方向。提出了把迈克耳孙干涉仪白光干涉的特征性彩虹条纹作为零光程差的定位参考标志,从而可以对光程差进行绝对测量,可以确切测量波片真正的相位延迟量和快轴方向。利用此方法对商用1/4波片进行了测量,实验结果表明所提出的迈克耳孙干涉仪零光程差法是行之有效的。最后还初步分析了色散对测量的影响,讨论了本方法适用的波片范围。
The method of determining the parameters of wave plate based on the intensity measurement of polarized light is analyzed, and the uncertainty of this kind of method in the measurement of arbitrary wave plate is pointed out. The analysis shows that there is a multi-valued function relationship between the phase retardation of the wave plate and the light intensity measurement, so the true value of the retardation of the wave plate can not be determined only by the light intensity measurement of the linear polarization component, Times and fast axis direction. The characteristic rainbow streaks of the white interference of the Michelson interferometer are proposed as the reference mark of zero optical path difference, so that the optical path difference can be measured absolutely and the true phase retardation and fast axis direction can be exactly measured. The commercial quarter-wave plate was measured by this method. The experimental results show that the proposed Michelson interferometer zero-path difference method is effective. Finally, the influence of dispersion on the measurement is also analyzed. The range of the wave plate suitable for this method is discussed.