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为克服InGaAs/InP雪崩二极管(APD)光电探测器的后脉冲现象,本文提出了基于FPGA的单光子探测器(SPD)测量系统,其门控频率最高可达100MHz,门控宽度最窄可到1ns,死区时间设定为109ns,并且这些参数都易于调节且有助于减少后脉冲概率。实验结果表明:在以上门控条件并且制冷温度为218K时,探测器的有效门宽为0.79ns;在死区时间超过109ns时,后脉冲现象可忽略;最大光子探测效率(PDE)约为14%;在光子探测效率为10%时,暗计数率(DCR)约为2×10-5/ns;并具有小型化、易调节的特点。
In order to overcome the post-impulse phenomenon of InGaAs / InP avalanche photodiodes (APD) photodetectors, this paper proposes a single-photon detector (SPD) measurement system based on FPGA with gated frequency of up to 100MHz and narrow gating width 1ns, dead time is set to 109ns, and these parameters are easy to adjust and help to reduce post-pulse probability. The experimental results show that the effective gate width of the detector is 0.79ns at the above gate condition and the cooling temperature is 218K. The post-pulse phenomenon is negligible when the dead time exceeds 109ns. The maximum photon detection efficiency (PDE) is about 14 %; When the photon detection efficiency is 10%, the dark count rate (DCR) is about 2 × 10-5 / ns; and it is miniaturized and easy to adjust.