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研究了位于小麦５ＡＬ染色体上的Ｖｒｎ１－Ｆｒ１区间用于小麦耐寒力育种操作上的可行性。该区间上含有影响春化要求和耐寒力水平的基因。我们利用Ｖｒｎ１－Ｆｒ１区间上等位基因有差异的小麦近等基因系进行了植株半致死温度试验（ＬＴ５０），以明确该区间对耐寒与不耐寒小麦的效应。近等基因系来源于一个以春小麦Ｍａｒｆｅｄ为轮回亲本，以两个冬小麦Ｓｕｗｅｏｎ１８５和Ｃｈｕｇｏｋｕ８１为供体亲本的５次回交后代，前者耐寒而后者不耐寒。建立的群体为Ｓｕｗｅｏｎ１８５／６＊Ｍａｒｆｅｄ和Ｃｈｕｇｏｋｕ８１／６＊Ｍａｒｆｅｄ春性和冬性近等基因系（ＮＩＬｓ）。结果表明，冬性小麦近等基因系能够忍耐的ＬＴ５０温度较春性小麦近等基因系的ＬＴ５０值低４．３℃。Ｓｕｗｅｏｎ１８５／６＊Ｍａｒｆｅｄ冬性ＮＩＬｓ耐受的ＬＴ５０值较Ｃｈｕｇｏｋｕ８１／６＊Ｍａｒｆｅｄ冬性ＮＩＬｓ的ＬＴ５０值低０．５℃。研究表明这些基因型间的ＬＴ５０差异的７１％～９１％可以用Ｖｒｎ１－Ｆｒ１区间获得解释。用探针Ｘｗｇ６４４分析这些ＮＩＬｓ来确认其与Ｖｒｎ１－Ｆｒ１区间的连锁性，并证明其作为春化需求耐寒标记的作用。冬性和春性ＮＩＬｓ的ＤＮＡ用ＥｃｏＲＩ消化，以Ｘｗｇ６４４作?
The feasibility of the Vrn1-Fr1 interval locating on chromosome 5AL of wheat was studied for wheat cold tolerance breeding. The interval contains genes that affect the vernalization and cold tolerance levels. In this study, LT50 was used to determine the effect of this interval on cold-tolerant and non-tolerant wheat using the wheat alleles with different alleles in the Vrn1-Fr1 interval. The near isogenic lines originated from a backcross generation of five backcrossed generations with Marfed as the reincarnation parent and two winter wheat Suweon185 and Chugoku81 as the donor parents. The former was hardy and the latter was not hardy. The established populations were Suweon185 / 6 * Marfed and Chugoku81 / 6 * Marfed spring and winter near isogenic lines (NILs). The results showed that the LT50 temperature of winter wheat near-isogenic lines was 4.3 ℃ lower than the LT50 of spring wheat near-isogenic lines. LT50 values for Suweon185 / 6 * Marfed winter NILs are 0.5 ° C lower than the LT50 values for Chugoku81 / 6 * Marfed winter NILs. Studies show that 71% to 91% of the LT50 differences between these genotypes can be explained by the Vrn1-Fr1 interval. These NILs were analyzed with probe Xwg644 to confirm its linkage to the Vrn1-Fr1 interval and to demonstrate its role as a marker of vernalization in cold tolerance. DNA from winter and spring NILs is digested with EcoRI and made with Xwg644?