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随着SoC的复杂度和规模的不断增长,SoC的测试变得越来越困难和重要。针对某复杂32-bit RISC SoC,提出了一种系统级DFT设计策略和方案。在该方案中,运用了多种不同测试设计方法,包括内部扫描插入、存储器内建自测试、边界扫描和功能测试矢量复用。结果显示,该策略能取得较高的测试覆盖率和较低的测试代价。
As SoCs have grown in sophistication and scale, SoC testing has become more and more difficult and important. For a complex 32-bit RISC SoC, a system-level DFT design strategy and solution is proposed. In this scenario, a number of different test design approaches are used, including internal scan insertion, memory built-in self-test, boundary scan and functional test vector re-use. The results show that the strategy can achieve higher test coverage and lower test cost.