论文部分内容阅读
本文介绍了可从0.7～4.0μm(1.77～0.31eV)进行波长扫描的光电流测试系统及其技术特点,测量了GaAs和InP样品的深能级,这些数据同有关文献测量的结果基本一致。
In this paper, the photocurrent testing system which can scan wavelength from 0.7 ~ 4.0μm (1.77 ~ 0.31eV) and its technical characteristics are introduced. The deep level of GaAs and InP samples are measured. These data are basically the same as those measured in literature.