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随着大规模集成电路技术的发展,电路的复杂程度日益提高,相应地电路的引出端(压焊点)的数目也在增加。目前已有18脚,24脚、28脚和40脚的管壳,所以电路也将有这么多引出端。在测试时,就要有这么多的探针,并要同时扎在电路芯片的对应端上,这是困难的。因此,测试时首先遇到的问题,就是判断探针是否与压焊点接触上了。若有一根探针未触上压焊点,那末即使是一个合格的芯片,测试结果也将是不合格的。所以,这是一个值得重视的问题。这里介绍一种注入逻辑(I~2L)大规模集成电路的接触判断仪,它具有线路简单,所需元、器件较少,调整方便等特点,经一段时间的实际使用,效果较好。
With the development of large-scale integrated circuit technology, the complexity of the circuit is increasing day by day, correspondingly the number of the leading-out end of the circuit (pressure-welded joint) is also increased. There are currently 18, 24, 28 and 40-pin housings, so the circuit will have so many extractors. It is difficult to have so many probes at the time of testing that they must be simultaneously applied to the corresponding ends of the circuit chip. Therefore, the first test encountered the problem is to determine whether the contact probe with the pressure on the. If a probe does not touch the pad, then even a qualified chip, the test results will be unqualified. So, this is a problem worth attention. Here introduced a logic injection (I ~ 2L) large-scale integrated circuit contact determination device, which has a simple circuit, the required elements, fewer devices, easy to adjust and so on, after a period of actual use, the effect is better.