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1.引言大规模集成电路和计算机的设计、生产和使用过程中都需要进行各种测试。测试按目的可分为设计验证、生产测试(包括中间测试)和维护测试。测试方法的选择与测试目的和测试对象有关。本文介绍的测试码产生算法主要是针对后两种测试的,而测试对象主要是针对中小规模集成电路和插件板一级的。测试码的产生是测试的关键环节。经典的测试码产生算法是在小规模集成
1. Introduction Large-scale integrated circuits and computers in the design, production and use of the process needs to be a variety of tests. According to the purpose of the test can be divided into design verification, production testing (including intermediate testing) and maintenance testing. The choice of test method is related to the purpose of the test and the test object. This article describes the test code generation algorithm is mainly for the latter two tests, and the test object is mainly for small and medium scale integrated circuits and plug-in board level. Test code generation is a key part of the test. The classic test-code generation algorithm is small-scale integration