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我们在不同温度下对Tl2Ba2Cu2Cu2O8高温超导薄膜进行了本征约瑟夫森效应研究．对薄膜微桥I—V特性和临界电流随温度变化关系的测试表明，Tl2Ba2CaCu2O8薄膜中的本征约瑟夫森效应呈现SIS结特性．
We studied the intrinsic Josephson effect of Tl2Ba2Cu2Cu2O8 high temperature superconducting thin films at different temperatures. Tests on the relationship between the I-V characteristics and the critical current of the thin-film micro-bridge show that the intrinsic Josephson effect in the T12Ba2CaCu2O8 film exhibits the SIS junction characteristics.