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如今扫描隧道显微镜(S TM)已成为追踪、探测材料表面构形的常规装置.这一装置的原理是利用了电子可能跃过两个紧凑且分隔的传导表面间(一是毫微米尺寸的显微镜测头,另一为被测样品)的绝缘间隙的极小几率.在此基础上发展
Now scanning tunneling microscopy (S TM) has become a common device for tracking and probing the surface configuration of a material, the principle of which is to take advantage of the fact that electrons can jump between two compact and spaced conducting surfaces (one is a nanometer size microscope Probe, the other for the measured sample) the minimum probability of insulation gap. On the basis of this development