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铝合金在钎焊过程中对钎剂去膜机理问题的解决,有助于钎剂的不断改进和创新,有很大的实用意义。但是由于目前试验手段所限,工作难度较大,现采用的各种方法都有一定的片面性,所以众说纷纭:①认为卤素离子在氧化膜缺陷处渗入膜内与母材生成AlX_3,从而动摇了膜与母材的结合。②认为去膜是一个电化学过程,母材和氧化膜分别成为阳极和阴极,膜的脱落是由于膜下金属铝电化学溶解,从而破坏了其间的结合。③认为膜的脱落是由于氟化物在湿气作用下产生HF的作用。④则坚持大多数研究者不同的观点,即氧化膜的破坏是由于含氟化物的熔盐对膜的化学溶解,并认为这种溶解是一种吸附——电化学过程。所有这些说法都有一
Aluminum alloy brazing flux removal mechanism in the process of solving the problem, contribute to the flux of continuous improvement and innovation, have great practical significance. However, due to the limitations of the current test methods, the work is more difficult, the methods used are a certain one-sidedness, so different opinions: ① that the halide ions infiltrated into the film defects in the film with the base metal to generate AlX_3, which shaken the film Combination with base metal. ② that the membrane is an electrochemical process, the base metal and the oxide film were the anode and cathode, the film is due to fall off the membrane under the electrochemical dissolution of aluminum, thus undermining the combination. ③ that the film is due to fluoride off the role of moisture in the role of HF. ④ Adhere to the different viewpoints of most researchers that the destruction of the oxide film is due to the chemical dissolution of the fluoride-containing molten salt into the film and that this dissolution is an adsorption-electrochemical process. All of these claims have one