中国光学学会红外光电器件专业委员会于5月5～10日在北戴河召开了红外材料器件参数测试技术交流会。这次会议由河北大学和电子部十一所负责筹备。参加会议的有来自研究所、工厂和高等院校等15个单位的近40名代表。红外光电器件专委会付主任委员电子部十一所林钧挺付总工程师出席并主持了会议。东道主河北大学陈衡同志讲了会议筹备情况。会上宣讲了16篇专业学术论文。华中工学院易新建同志介绍了国外有关方面的动态。这次会议是小型的专题技术座谈,是继武汉会议(1982年)后大家都做了较深入细致的工作后的一次交流。发言详细,讨论深入,总的来说开得比较活跃,收获较大。会上,就微机应用于红外器件D~*、光谱测试作了探讨,此项工作虽刚开始,但加快测试速度,简化操作,提高精度等优越性已显示出来;红外小光点检测和电荷收集扫描电子显微术对检测探测器光敏面的扩大和均匀性等提 China Optical Society of infrared optoelectronic devices Professional Committee on May 5 to 10 held in Beidaihe infrared materials and devices parameters testing technology exchange. The meeting was organized by Hebei University and Eleven Electronics Department. Nearly 40 delegates from 15 institutes, including institutes, factories and institutions of higher learning attended the conference. Infrared Optoelectronic Devices Commission to pay the chairman of the electronics department Eleven Lin Jun Ting Fu Chief Engineer attended and presided over the meeting. Comrade Chen Heng, host of Hebei University, talked about the preparations for the meeting. At the meeting, 16 professional academic papers were preached. Comrade Yi Xinjian of Huazhong Institute of Technology introduced the developments of relevant foreign parties. This meeting is a small-scale technical seminar, which is an exchange after everyone has done a thorough and detailed job after the Wuhan Conference (1982). Detailed speech, in-depth discussion, in general, open more active, gain more. At the meeting, the microcomputer was applied to the infrared device D ~ *, spectral test was discussed, although this work has just begun, but to speed up the test speed, simplify the operation, improve the accuracy and other advantages have been shown; small infrared spot detection and charge Collect scanning electron microscopy to detect detector light-sensitive surface of the expansion and uniformity and other mention