针对高温超导材料X射线衍射（XRD）谱上衍射峰大量重叠及明显定化的现象，使用位敏探测器及织构定量分析的改进最大炮法，准确地进行高Tc材料织构的定量分析实验指出：使用上述方法的织构定量分析软件，可从大量重叠极图获得准确的织构信息；使用带有位敏探测器的X射线衍射仪，可以提高重叠极图测量的准确度，减少复杂材料（低晶体对林具有重叠衍射峰或复相材料）织构定量分析难度 Aiming at the phenomenon that a large number of diffraction peaks on X-ray diffraction (XRD) spectra of high-temperature superconducting materials overlap with each other clearly, a modified detector based on position-sensitive detector and quantitative analysis of texture are used to accurately measure the texture of high Tc material Analytical experiments show that: using the above method of texture quantitative analysis software, can obtain accurate texture information from a large number of overlapping polarograms; the use of X-ray diffractometer with a bit-sensitive detector, can improve the accuracy of overlapping polarogram measurement, Reduce Complex Materials (Low Crystals with Overlapped Diffraction Peaks or Multiple Phase Materials on Wood) Quantitative Analysis of Texture Difficulty